CIMaINa serves as characterization facility for internals and externals, also via the establishment of research and characterization contracts and consultancies.

Quotations can be prepared upon request.


Atomic Force Microscopy

The following AFM characterizations of thin films, coatings and interfaces can be performed at CIMaINa:

  • Nanoscale surface morphology (roughness, specific area, aspect ratio,…)
  • Particle sizing (nanoparticles and aggregates, biomolecules – proteins, DNA.. – and their complexes, polypeptides)
  • Nano- and micro-friction and adhesion (tribology)
  • Nano- and micro-scale mechanical tests (Young’s modulus – up to E=100 MPa)
  • AC/DC electric impedance and dielectric constant
  • Surface electric charge and potential, IsoElectric Point

Measurements can be performed in air as well as in a controlled atmosphere and medium, including liquid buffers.


In addition, CIMAINA offers

  • Production and characterization of spherical (colloidal) probes (R = 2-100 μm).


Stylus profilometry

A stylus profilometer KLA Tencor P6 equipped with low-force capacitance sensor provides fast characterization of surface morphology with vertical resolution below 1nm, and lateral resolution of 1um.

Main applications:

  • Characterization of the step height (thickness) of thin films of hard, soft and ultra-soft materials
  • Characterization of surface roughness, waviness, and curvature
  • Pseudo 3D imaging by interpolation of parallel scans (nanometric/micrometric vertical/lateral resolution)
  • Overview and analysis of defect at micro and nano -scale over large areas


BET analysis

We provide accurate characterization of the total surface area and porosity of the porous materials, such as powders, polymers, and nanostructured thin films:

  • specific surface area (m2/g);
  • area and volume of micropores (pore diameter less than 2 nm) by means of t-plot analysis;
  • pore size distribution (by means of BJH analysis);
  • Total Pore Volume evaluation.

We provide thermal activity investigation of the  samples with an infrared camera (FLIR A6555 with close-up lens 1.5x (25um)), temperature range is from -40°C  to 650°C.


UV-VIS and IR spectroscopy


Dynamic Light Scatterinfg (DLS)


Metal oxide nanoparticle synthesis


Electrochemical Impedance Spectroscopy


3D printing