CIMaINa serves as characterization facility for internals and externals, also via the establishment of research and characterization contracts and consultancies.
Quotations can be prepared upon request.
Atomic Force Microscopy
The following AFM characterizations of thin films, coatings and interfaces can be performed at CIMaINa:
- Nanoscale surface morphology (roughness, specific area, aspect ratio,…)
- Particle sizing (nanoparticles and aggregates, biomolecules – proteins, DNA.. – and their complexes, polypeptides)
- Nano- and micro-friction and adhesion (tribology)
- Nano- and micro-scale mechanical tests (Young’s modulus – up to E=100 MPa)
- AC/DC electric impedance and dielectric constant
- Surface electric charge and potential, IsoElectric Point
Measurements can be performed in air as well as in a controlled atmosphere and medium, including liquid buffers.
In addition, CIMAINA offers
- Production and characterization of spherical (colloidal) probes (R = 2-100 μm).
CLASSIZER ONE – Single-Particle Extinction and Scattering
Main applications:
- Calibration-free optical properties characterization of solid particles in liquid suspension (both water and other solvents, such as ethanol)
- Measurements of liquid samples particle concentration (particles/mL)
- Determination of sample Particle Size Distribution (PSD)
- Quality Control of particle porosity, wetting, aspect ratio, payload, impurities, scraps
- Monitoring sample evolution and stability over time, assessing the potential formation of particle aggregates
- Hi-resolution Continuous Flow Analysis (CFA)
- Statistical approaches as Oversize Measure and PCA for Hi-Quality Batch-2-Batch analysis and out-of-specifics identifications in product formulation and production.
In addition, it is possible to provide, produce and characterize:
- standard calibration samples consisting of spherical, smooth, compact, polymeric spheres with known diameter and refractive index (PS, PMMA, PVC, SiOx, MF) suspended in pure MilliQ water (Res= 18 MΩ/cm2, TOC=2 ppb)
- oil-in-water emulsions with calibrated refractive indices, ranging from 1.44 up to 1.60
- “real” samples realized starting from dry mineral dust powders
Stylus profilometry
A stylus profilometer KLA Tencor P6 equipped with low-force capacitance sensor provides fast characterization of surface morphology with vertical resolution below 1nm, and lateral resolution of 1um.
Main applications:
- Characterization of the step height (thickness) of thin films of hard, soft and ultra-soft materials
- Characterization of surface roughness, waviness, and curvature
- Pseudo 3D imaging by interpolation of parallel scans (nanometric/micrometric vertical/lateral resolution)
- Overview and analysis of defect at micro and nano -scale over large areas
BET analysis
We provide accurate characterization of the total surface area and porosity of the porous materials, such as powders, polymers, and nanostructured thin films:
- specific surface area (m2/g);
- area and volume of micropores (pore diameter less than 2 nm) by means of t-plot analysis;
- pore size distribution (by means of BJH analysis);
- Total Pore Volume evaluation.
Microthermography
We provide thermal activity investigation of the samples with an infrared camera (FLIR A6555 with close-up lens 1.5x (25um)), temperature range is from -40°C to 650°C.